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Sep 07, 2024
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2023-2024 Course Catalog [ARCHIVED CATALOG]
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EE 720 - Designing for Testability
3 Semester Credit Hour(s)
Design for testability. Types of testing, functional testing, and structural testing. Automatic test pattern generation. Scanning and scan based design rules. Critical paths. Memory test and diagnostics. Built-in self-testing. ATE equipment, local and remote testing and limitations. Students will have access to on-line test workstations.
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